With competition stronger than ever for traditional telco and new video/data services, operators are focusing on QoS as a way to differentiate. At the same time, they are being faced with reducing expenses just to stay alive. Based on these current conditions, Anritsu has designed the MT9083B performance series to ensure networks are installed and operating properly while reducing the cost of measurement.

Many OTDRs claim to be able to test PON-based FTTx networks but being able to do it with both high resolution and high range is what sets the MT9083B Series apart. Splitters up to a single 1x64 or closely-spaced, distributed splitters are completely and accurately measured with industry-leading resolution. A 1650nm wavelength with integrated filter is also available for troubleshooting in-service PON systems.

For traditional point-to-point optical networks, the MT9083B series not only features up to 42 dB of dynamic range but achieves industry leading performance for measurement speed and measurable distance with minimum deadzone. This translates into significantly reduced testing times compared to other OTDRs on the market. With the MT9083B series, a 100km/62 mile fiber can be tested in as little as six seconds...many fibers can even be tested in realtime without any averaging due to the high performance optics.

ACCESS Master MT9083B Series highlights

• Ready to test in less than 15 seconds…and all day without recharging
• High resolution testing of PON-based FTTx networks featuring up to 64 splits
• Significantly reduced testing time for fiber spans from 10 m to 200 km
• Deadzones of less than one meter ensure complete fiber evaluation
• Intelligent analysis software identifies problem splices, connectors and even macrobends
• Rugged, sealed design provides years of service in the most challenging environments
• IP testing option verifies throughput, frame loss and point-to-point connectivity
• In-service testing for maintenance and troubleshooting
• Verify connector quality with optional connector inspection microscope