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Anritsu eNews Spring 08
   
eNews Spring 2009
 
  The latest LTE test solutions
   

When it comes to LTE, We're one step ahead.

 
 

MD8430A LTE Base Station Simulator - The new MD8430A LTE signalling tester provides 20 MHz bandwidth and the platform for LTE and SAE (System Architecture Evolution) for next generation mobile networks. The MD8430A meets the requirements specified within 3GPP as part of the Release 8 version of specifications within the 36 series.

As most networks will evolve from 3G, Anritsu’s test solution provides a convenient roadmap with Intersystem handover possible between the two platforms. Existing investment in tests and systems are preserved with an evolutionary path beyond HSPA. Building on our experience with GSM & 3G test, we are the first company to offer a full suite of test instruments for accurately analyzing 3.5G HSPA Evo and LTE user equipment and networks.

MD8435A LTE UE Simulator - The new MD8435A LTE UE Simulator for testing of LTE Basestations and networks supports the 3GPP standards for LTE, and provides a powerful test and simulation environment to verify the correct operation and performance of LTE network hardware as it is being delivered and tested into trial networks.

 
 
 


 

MF6900A Fading Simulator - The MF6900A Fading Simulator with MIMO functions is part of the 3GPP LTE test solution portfolio. This solution will provide leading edge capability to designers of LTE terminals to help verify MIMO implementations, and to ensure the high data rate capabilities of 3GPP LTE are correctly realized in commercial devices.

When implementing MIMO into LTE terminals, the technology issues faced by terminal and chipset vendors require testing of throughput in a real radio-propagation environment that includes fading and multi-paths. As a result, vendors need to emulate a fading environment to perform non-RF protocol and performance tests.

 
When combined with the MD8430A LTE Base Station Simulator, the MF6900A uses full digital processing to meet this need by outputting an LTE multi-path fading profile that faithfully emulates 2x2MIMO, SISO, SIMO and MISO environments. In addition, close integration between the MF6900A and MD8430A offers a user-friendly set-up even for operators with no experience of complex fading test environments. 
  Links Other Downloads 
     
  LTE - Technology Page Mobile World Congress LTE Overview 2009
    Leaflet - Powerful Support for Developing Next-Generation LTE Chipsets and Mobiles
    LTE White Paper - get your copy now
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